- Customer-supplied or developed in-house
Ruggedization of existing (lab-built) fixtures
Co-develop hardware/software
Deployment, implementation, and training
Engineering evaluation tools
Design verification
Medical device evaluation
Manufacturing test systems
Verification test systems
Go/No-go tests
Serialization, recordkeeping, and datalogging
Troubleshooting failed units with other test platforms
- Bring us your data, documentation, and failed boards
We take in boards that have failed system and functional test
Give us a little time and we'll try to bring most of them back to life
Employing all test engineering resources and test platforms at Datest's disposal
We can either rework for you or tell you where to rework if you prefer
We will work with you to define what a "good board" is once we've finished
Recovery at a fraction of the original burdened manufactured cost
Ideal for reverse logistics, warranty repair, and returns management programs
No-cost/no-risk feasibility studies available for higher-volume requirements
- Troubleshooting, repair, and retest of failed boards
BGA removal and replacement
CAD and gerber file conversion services
Mechanical DFT (Design For Testability) analysis
Electrical DFT analysis
Test strategy consultation and implementation
Test sanity checking
DFM (Design For Manufacturability) analysis
Lot tracking and statistical reporting
Mixed OEM/EMS Provider engagements
Goepel CASCON GALAXY
- Industry-leading CASCON GALAXY software and SCANFLEX hardware
- Support for up to 8 individual and independent scan chains
- Design For Test Analysis and Test Coverage Analysis
- Stand-alone and/or integrated with Flying Probe Test
- JTAG controlled test and in-system programming, included
- Detection and diagnosis of opens, shorts, and stuck-at Programming of Flash, serial EEPROM, CPLD, on-chip memory
- Mixed signal test
- Test of peripheral interfaces on the unit under test
- JTAG controlled dynamic tests through VarioTAP
- Custom test development in addition to ATPG, including access to on-chip test instruments, such as Built-In Self Test
- Enhanced mechanical accuracy with closed loop motion control servodrive, (.012 um resolution)
- Dual sided probing simultaneously on both sides of the PCBA increases test coverage and reduces board handling
- Measurement electronics directly on axis to minimize transmission path length and reduce signal noise
- New DSP based In Circuit instrumentation with 16 bit resolution increases measurement resolution and reduces test execution time
- Faster probe movement with use of lighter alloy in X, Y, and Z axis
- Full integration with Goepel Boundary Scan tools
- New Leonardo software simplifies program development with automatic debug and program tuning
- Utilize up to 6 flying probes as JTAG drivers and sensors, extending boundary scan test coverage
- Create mixed signal tests utilizing boundary scan access on the UUT and analog test capabilities on flying probes;
- Shorten flying probe test time by utilizing boundary scan for digital short testing
- Optimize test coverage and test strategy by combining the industry's leading boundary scan and flying probe test systems
