Boundary Scan/JTAG Testing and Test Engineering
Benchtop Configuration
- Industry-leading CASCON GALAXY software and SCANFLEX hardware
- Support for up to 8 individual and independent scan chains
- Design For Test Analysis and Test Coverage Analysis
- Stand-alone and/or integrated with Flying Probe Test
- JTAG controlled test and in-system programming, incl.
- detection and diagnosis of opens, shorts, and stuck-at
- programming of Flash, serial EEPROM, CPLD, on-chip memory
- mixed signal test
- test of peripheral interfaces on the unit under test
- JTAG controlled dynamic tests through VarioTAP
- detection and diagnosis of opens, shorts, and stuck-at
- Custom test development in addition to ATPG, including access to on-chip test instruments, such as Built-In Self Test
- Scanworks is an integrated software and hardware boundary scan test and development system developed by Asset-Intertech (www.asset-intertech.com). The software consists of a graphical user interface, cad translation tools, model library management, test development and debug, fault coverage analysis and fault analysis tools. The hardware consists of several forms of PC based interfaces from the software to a boundary scan
compliant PCB. From single port USB pods to multi port PCI based pods.
Integrated Flying Probe Configuration
Goepel CASCON GALAXY integrated with SPEA 4060
- Enhanced mechanical accuracy with closed loop motion control servodrive, (.012 um resolution)
- Dual sided probing simultaneously on both sides of the PCBA increases test coverage and reduces board handling
- Measurement electronics directly on axis to minimize transmission path length and reduce signal noise
- New DSP based In Circuit instrumentation with 16 bit resolution increases measurement resolution and reduces test execution time
- Faster probe movement with use of lighter alloy in X, Y, and Z axis
- Full integration with Goepel Boundary Scan tools
- New Leonardo software simplifies program development with automatic debug and program tuning
- Utilize up to 6 flying probes as JTAG drivers and sensors, extending boundary scan test coverage
- Create mixed signal tests utilizing boundary scan access on the UUT and analog test capabilities on flying probes;
- Shorten flying probe test time by utilizing boundary scan for digital short testing
- Optimize test coverage and test strategy by combining the industry's leading boundary scan and flying probe test systems
