- Customer-supplied or developed in-house
Ruggedization of existing (lab-built) fixtures
Co-develop hardware/software
Deployment, implementation, and training
Engineering evaluation tools
Design verification
Medical device evaluation
Manufacturing test systems
Verification test systems
Go/No-go tests
Serialization, recordkeeping, and datalogging
Troubleshooting failed units with other test platforms
- Bring us your data, documentation, and failed boards
We take in boards that have failed system and functional test
Give us a little time and we'll try to bring most of them back to life
Employing all test engineering resources and test platforms at Datest's disposal
We can either rework for you or tell you where to rework if you prefer
We will work with you to define what a "good board" is once we've finished
Recovery at a fraction of the original burdened manufactured cost
Ideal for reverse logistics, warranty repair, and returns management programs
No-cost/no-risk feasibility studies available for higher-volume requirements
- Troubleshooting, repair, and retest of failed boards
BGA removal and replacement
CAD and gerber file conversion services
Mechanical DFT (Design For Testability) analysis
Electrical DFT analysis
Test strategy consultation and implementation
Test sanity checking
DFM (Design For Manufacturability) analysis
Lot tracking and statistical reporting
Mixed OEM/EMS Provider engagements
In-Circuit Testing and Test Engineering
Agilent 3070
- 5184 Test Nodes
- HPUX or Windows
- 60 Mhz ASRU Frequency Counter, Timer
- 10 Mhz Clock, 6 Mhz data rates
- Vector Test for VLSI, PLCC & ASICS
- Testjet and VTEP Vectorless Testing
- Advanced Boundary Scan
- Silicon Nails Available
- Series V upgradeable
GenRad 2287
- 3560 Hybrid Test Nodes
- Windows Interface
- Total GenRad 227X Migration Capability
- 20 Mhz Clock, Sync, and Trigger, 5 Mhz data rates
- Vector Test for VLSI, PLCC’s & ASICS
- Test Express Vectorless Testing
- Multiple Chain Boundary Scan
- Analog Functional Test Module
Teradyne Z1820
- 2048 Pure Pin Test Nodes
- 3 & 6-wire Analog Measurements
- Vector Test for VLSI, PLCC’s & ASICS
- Multiscan II Vectorless Testing
- IEEE Functional Interface Board
- Large Custom Vector Library
Teradyne Z1890
- 2048 Pure Pin Test Nodes
- 3 & 6-wire Analog Measurements
- Vector Test for VLSI, PLCC’s & ASICS
- Multiscan II Vectorless Testing
- IEEE Functional Interface Board
- Large Custom Vector Library
