Links > News > Datest Wins Global Technology Award for Its SPEA 4060 with GOEPEL/JTAG Boundary Scan Technology

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FREMONT, CA — November 2011 — Datest, a leading provider of advanced, efficient and quality in-circuit testing solutions, announces that it has been awarded a Global Technology Award in the category of Test Services for its SPEA 4060 Flying Probe Tester with GOEPEL Boundary Scan. The award was presented to the company during a Tuesday, November 15, 2011 ceremony that took place at the New Munich Trade Fair Centre in Munich, Germany during Productronica 2011.

Premiering in 2005, the Global Technology Awards program is an annual celebration of product excellence in electronics surface mount assembly. Premier products based on the finest examples of creative advancement in technology are chosen by a distinguished panel of industry experts.

Datest is the first test services company in the US to fully integrate the new SPEA 4060 Flying Probe Tester with the latest GOEPEL JTAG /boundary scan tools. The combination of electrical test, optical inspection and boundary scan in a single platform provides complete one-stage testing with extremely high test coverage while lowering the cost of test.

The 4060 double-sided flying probe tester now has the ability to test connections on nets that are not completely testable using conventional means by providing "virtual" test points on nets without full access. Test time is reduced due to fewer required probe movements since boundary scan test points can be used to reduce the number of required probe points. Nets that are covered by boundary scan can be excluded from the SPEA test run.

The integration combines the best of in-circuit testing , boundary scan testing and flying probe testing . The system has been optimized in a manner that provides the benefits of a single software interface. The automatic test program generation is able to combine in-circuit and boundary scan test, avoiding any redundancy in the test coverage, thereby further optimizing test time. All of the tests that are covered by boundary scan are no longer performed during in-circuit testing.

With the integration of the 4060 Flying Probe with GOEPEL JTAG/Boundary Scan, the 4060 now supports probe-level integration of GOEPEL's JTAG/Boundary Scan technology. The boundary scan cells are connected with the 4060 Flying Prober's digital channels through the test points. During the test, the contacting probe works as an additional, virtual boundary scan cell, enabling the detection of a non-soldered pin. This provides a system approach that supports the test needs for UUTs with both analog and digital test requirements, and results in optimum test coverage.

Datest is a GOEPEL Center of Expertise for engineering and application of JTAG/Boundary scan test solutions. For more information about GOEPEL electronic's boundary scan test solution, visit .

For more information about the SPEA 4060 Flying Probe System, visit . Datest is the West Coast USA Demonstration Site for SPEA flying probe printed circuit board assembly test systems. For more information about Datest or to view the company's full service lineup, visit

For more information about Datest, and to experience the new Web site for yourself, visit