Streamlining Test Development: From CAD to production-ready Test Program in under 60 minutes

In today’s electronics manufacturing environment, test development speed is becoming just as critical as test coverage.

Join Datest for this educational webinar featuring SPEA’s Dustin Warren, VP of Sales & Regional Director, as he demonstrates how manufacturers can move from board CAD data to a production-ready test program in under 60 minutes.

Learn how automatic TPGM generation and auto-debug capabilities dramatically reduce programming time while maintaining high coverage for complex PCBAs. The result: improved repeatability, faster ramp to production, and a more efficient test development process.

This session is designed for engineers, test developers, manufacturing leaders, and quality professionals responsible for test strategy, programming, or evaluating test equipment.

Register here: https://meeting.zoho.com/meeting/register?sessionId=1093958960