Data-Driven PCB Test Planning

In today’s electronics manufacturing environment, effective test planning must begin before PCB design constraints limit your options.

Join Datest for this educational webinar featuring ASTER Technologies’ Will Webb, Technical Director, as he discusses how to build effective PCB test strategies that align with design realities from the start.

Learn how boundary scan analysis, clustering capabilities, and “what-if” scenario planning can help maximize test coverage while reducing the need for physical test access. Will will also explore how gap analysis and historical quality data, including DPMO metrics, can help teams identify and target the highest-impact defect risks.

This session is designed for test engineers, design engineers, manufacturing professionals, and quality professionals responsible for developing test strategies and improving PCB test coverage.

Register here: https://meeting.zoho.com/meeting/register?sessionId=1063432587